Second harmonic spectroscopy of silicon nanocrystals

dc.contributor.advisorDowner, Michael Coffinen
dc.creatorFigliozzi, Peter Christopher, 1972-en
dc.date.accessioned2008-08-28T23:53:41Zen
dc.date.available2008-08-28T23:53:41Zen
dc.date.issued2007en
dc.description.abstractUsing a novel two-beam technique developed to greatly enhance quadrupolar contributions to the second-order nonlinear polarization, we performed a nonlinear spectroscopic study of silicon nanocrystals implanted in an SiO₂ matrix.en
dc.description.departmentPhysicsen
dc.format.mediumelectronicen
dc.identifier.oclc191733238en
dc.identifier.urihttp://hdl.handle.net/2152/3531en
dc.language.isoengen
dc.rightsCopyright © is held by the author. Presentation of this material on the Libraries' web site by University Libraries, The University of Texas at Austin was made possible under a limited license grant from the author who has retained all copyrights in the works.en
dc.subject.lcshSilicon crystalsen
dc.subject.lcshSecond harmonic generationen
dc.subject.lcshNanocrystalsen
dc.subject.lcshSilicaen
dc.titleSecond harmonic spectroscopy of silicon nanocrystalsen
dc.type.genreThesisen
thesis.degree.departmentPhysicsen
thesis.degree.disciplinePhysicsen
thesis.degree.grantorThe University of Texas at Austinen
thesis.degree.levelDoctoralen
thesis.degree.nameDoctor of Philosophyen

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