High-gain, low-noise avalanche photodiodes grown by molecular beam epitaxy

dc.contributor.advisorBank, Seth Robert
dc.contributor.committeeMemberYu, Ed T
dc.contributor.committeeMemberTutuc, Emanuel
dc.contributor.committeeMemberWang, Zheng
dc.contributor.committeeMemberWang, Yaguo
dc.creatorMaddox, Scott Joseph
dc.creator.orcid0000-0001-5454-4984
dc.date.accessioned2017-05-03T19:55:06Z
dc.date.available2017-05-03T19:55:06Z
dc.date.issued2015-05
dc.date.submittedMay 2015
dc.date.updated2017-05-03T19:55:07Z
dc.description.abstractAvalanche photodiodes (APDs) are important components in short-wave and mid-wave infrared detection systems (imaging, laser radar, communications, etc.) because their internal gain can improve receiver sensitivity and enables the detection of weak photon fluxes. In the mid-infrared, HgCdTe APDs represent the current state-of-the-art; at liquid nitrogen temperatures, advanced devices offer excellent low noise characteristics, multiplication gains of > 1000, and excellent dark currents. However, challenges associated with the growth and fabrication of II-VI compounds has motivated the search for alternative APD materials. InAs APDs, which offer a cutoff wavelength of 3-3.5 μm, have recently been found to exhibit gain and noise characteristics similar to HgCdTe APDs. These characteristics, in addition to the inherent compositional uniformity, stability at temperatures in excess of 500 °C, and potential availability from commercial III-V foundries, make InAs APDs attractive for a variety of applications in the short-wave and mid-wave infrared, including free-space optical communications, chalcogenide fiber-optics, gas detection and monitoring, thermal imaging, and 3D laser detection and ranging (LIDAR). However, the performance of state-of-the-art InAs APDs has thus-far been limited by excessive dark current and unintentional background doping concentrations, which restrict the practical operating temperatures and limit the achievable multiplication gain. In this dissertation, we describe advances made in the design, growth and fabrication of low-noise InAs APDs that resulted in reduced dark currents and background doping, culminating in record high multiplication gains in excess of 300 while maintaining extremely low-noise operation. In addition, we explore one promising approach for extending the cutoff wavelength of these devices, namely the incorporation of dilute amounts of bismuth (Bi) into InAs, resulting in the highly-mismatched alloy InAsBi. Finally, we report, for the first time, on the development of novel AlInAsSb staircase APDs, which are predicted to provide further enhanced gain and noise characteristics over bulk InAs APDs through application of the staircase APD concept, first proposed by Capasso et al.
dc.description.departmentElectrical and Computer Engineering
dc.format.mimetypeapplication/pdf
dc.identifierdoi:10.15781/T2SB3X44P
dc.identifier.urihttp://hdl.handle.net/2152/46683
dc.language.isoen
dc.subjectPhotodetector
dc.subjectAvalanche photodiode (APD)
dc.subjectMolecular beam epitaxy (MBE)
dc.subjectInAs
dc.subjectInAsBi
dc.subjectAlInAsSb
dc.titleHigh-gain, low-noise avalanche photodiodes grown by molecular beam epitaxy
dc.typeThesis
dc.type.materialtext
thesis.degree.departmentElectrical and Computer Engineering
thesis.degree.disciplineElectrical and Computer Engineering
thesis.degree.grantorThe University of Texas at Austin
thesis.degree.levelDoctoral
thesis.degree.nameDoctor of Philosophy

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