Microwave impedance microscope study of two dimensional materials
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Date
2015-05
Authors
Liu, Yingnan, Ph. D.
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Abstract
In this thesis, I will introduce a unique technique, microwave impedance microscope (MIM), which has shown its potential in characterization of local electrical inhomogeneity of materials. I will also discuss some results about the study of In₂Se₃ and MoS₂ electrical properties with MIM.
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