Polarization-sensitive spectral interferometry

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dc.contributor.assigneeBoard of Regents, The University of Texas System
dc.creatorThomas E. Milner
dc.creatorEunha Kim
dc.creatorNathaniel J. Kemp
dc.date.accessioned2019-10-23T14:02:09Z
dc.date.available2019-10-23T14:02:09Z
dc.date.filed2011-12-15
dc.date.issued2013-10-29
dc.description.abstractA polarization sensitive spectral interferometer apparatus and method for analyzing a sample by optical energy reflected from the sample. The polarization sensitive spectral interferometer apparatus and method determines polarization properties of the sample by optical energy reflected from the sample.
dc.description.departmentBoard of Regents, University of Texas System
dc.identifier.applicationnumber13327492
dc.identifier.patentnumber8570527
dc.identifier.urihttps://hdl.handle.net/2152/76396
dc.identifier.urihttp://dx.doi.org/10.26153/tsw/3485
dc.publisherUnited States Patent and Trademark Office
dc.relation.ispartofUniversity of Texas Patents
dc.relation.ispartofUniversity of Texas Patents
dc.rights.restrictionOpen
dc.rights.restrictionOpen
dc.subject.cpcA61B1/00096
dc.subject.cpcA61B1/00167
dc.subject.cpcA61B1/00172
dc.subject.cpcA61B5/0066
dc.subject.cpcA61B5/0075
dc.subject.cpcA61B5/0084
dc.subject.cpcA61B5/6852
dc.subject.cpcA61B5/0086
dc.subject.cpcA61B5/4523
dc.subject.cpcA61B5/7257
dc.subject.cpcG01B9/02091
dc.subject.cpcG01B9/02004
dc.subject.cpcG01B9/02069
dc.subject.cpcG01B9/02097
dc.subject.cpcG01B2290/70
dc.subject.uspc356/479
dc.subject.uspc356/495
dc.subject.uspc356/497
dc.titlePolarization-sensitive spectral interferometry
dc.typePatent

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