Open series fault comparison in ac & dc micro-grid architectures

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dc.creatorEstes, H.Ben
dc.creatorKwasinski, A.en
dc.creatorHebner, R.E.en
dc.creatorUriarte, F.M.en
dc.creatorGattozzi, A.L.en
dc.date.accessioned2015-09-04T16:06:02Zen
dc.date.available2015-09-04T16:06:02Zen
dc.date.issued2011-10en
dc.description.abstractThis paper explores empirical observations of open series fault (arc fault) testing during current interruptions. Emphasis is on dc systems, but arc behavior is also compared to that of ac systems under >quasi-equivalent> circuit parameters. Specific parameters that are considered regarding arc behavior include gap voltage, current, dissipated power, voltage and current transient characteristics, reignition, bus disturbances, and contact position during dc arc collapse. Based on these results, comparisons between ac and dc systems seem to indicate that different arc-related challenges exist for both dc and ac architectures.en
dc.description.departmentCenter for Electromechanicsen
dc.identifierPR_526en
dc.identifier.citationH.B. Estes, A. Kwasinski, R.E. Hebner, F.M. Uriarte, and A.L. Gattozzi, “Open series fault comparison in ac & dc micro-grid architectures,” 2011 IEEE 33rd International Telecommunications Energy Conference (INTELEC), Amsterdam, The Netherlands, October 9-13, 2011, pp. 1-6.en
dc.identifier.urihttp://hdl.handle.net/2152/30765en
dc.language.isoenen
dc.publisherIEEEen
dc.relation.ispartofCEM Publicationsen
dc.rights.restrictionopenen
dc.subjectGrid Solutionsen
dc.subjectESRDCen
dc.subjectelectric shipen
dc.subjectdirect currenten
dc.subjectopen series faulten
dc.subjectarc transienten
dc.subjectspikeen
dc.subjectcurrent interruptionen
dc.subjectmicro-griden
dc.titleOpen series fault comparison in ac & dc micro-grid architecturesen
dc.typeconference paperen

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