Selective Laser Melting of Pure Tin: Microstructure Study

Selective Laser Melting (SLM) of pure tin was examined and 3D samples were successfully fabricated. High relative density of 99.9 % was achieved. Microstructure study was carried out via a combination of X-ray diffraction (XRD), light microscopy (LOM) and electron backscatter diffraction (EBSD). Under LOM, columnar structures, some spanning the entire height of the sample, are observed in the vertical plane. This study also examines the variation of relative density against process parameters such as hatch spacing and the input volumetric energy density for the SLM of tin.