Utilizing Topological Information to Increase Scan Vector Generation Efficiency

Demands for increased Solid Freeform Fabrication precision and speed suggest the need for advanced scanning techniques, such as boundary tracing, half-lap and multiple orientation scanning, or 'intel nt' scanning. Since most SFF processes construct parts from parallel material layers, separating model slicing and scan conversion functions appears to be a powerful approach. Both can benefit from increased topological information. This paper addresses the issue of improving model slicing by utilizing topological data to increase performance, and consequently, improve the efficiency with which scan vectors can be generated.