Statistics for Automatic semiconductor wafer map defect signature detection using a neural network classifier

Total visits

views
Automatic semiconductor wafer map defect signature detection using a neural network classifier 889

Total visits per month

views
October 2023 4
November 2023 0
December 2023 0
January 2024 1
February 2024 1
March 2024 2
April 2024 0

File Visits

views
RADHAMOHAN-MASTERS-REPORT.pdf(legacy) 542
RADHAMOHAN-MASTERS-REPORT.pdf 443

Top country views

views
United States 573
China 94
France 58
Taiwan 50
South Korea 31
Singapore 31
India 29
United Kingdom 28
Germany 23
Netherlands 18
Belarus 12
Malaysia 8
United Arab Emirates 7
Italy 7
Ireland 5
Russia 5
Austria 4
Hong Kong SAR China 4
Israel 4
Iran 3
AP 2
Turkey 2
Armenia 1
Brazil 1
Czechia 1
Denmark 1
New Zealand 1
Philippines 1
Romania 1
Sweden 1
Thailand 1
Ukraine 1
Vietnam 1

Top city views

views
Beverly Hills 72
Ashburn 61
Beijing 41
Miami 41
Woodbridge 41
Austin 30
Taipei 27
Singapore 26
Houston 20
Redwood City 20
Sunnyvale 20
Seoul 15
Palo Alto 13
Santa Clara 11
Mountain View 10
Hsinchu 9
Columbus 8
Shanghai 8
Bangalore 7
Milton Keynes 7
Zhengzhou 7
Fort Lauderdale 6
New Delhi 6
Tokyo 6
Dallas 5
Paris 5
San Jose 5
Clifton Park 4
Jacksonville 4
Seattle 4
Shenzhen 4
Taichung 4
Dublin 3
Fredericksburg 3
Hefei 3
Kansas City 3
Mcallen 3
Milan 3
Pflugerville 3
Putian 3
San Diego 3
Sharjah 3
Tianjin 3
Troy 3
Boardman 2
Changsha 2
Chennai 2
Council Bluffs 2
Cupertino 2
Daejeon 2
Fort Mill 2
Fujisawa 2
Hangzhou 2
Kalsdorf bei Graz 2
Laurel 2
Lyon 2
Menlo Park 2
Midvale 2
Milpitas 2
Munich 2
Nagapattinam 2
Noida 2
Scottsdale 2
State College 2
Tucson 2
Winston Salem 2
Abu Dhabi 1
Akron 1
Alexandria 1
Ansan 1
Auckland 1
Ballston Lake 1
Bangkok 1
Bengaluru 1
Berlin 1
Bethpage 1
Bobigny 1
Brookings 1
Cary 1
Cedar Park 1
Chandler 1
Changhua 1
Chelmsford 1
Chengdu 1
Chongqing 1
Cormano 1
Crolles 1
Cunewalde 1
Des Moines 1
Dresden 1
Durham 1
East Syracuse 1
El Segundo 1
Erragadda 1
Fiumicino 1
Frankfurt am Main 1
Fremont 1
Geldrop 1
Glasgow 1
Hanoi 1