All-epitaxial guided-mode resonance mid-wave infrared detectors

dc.creatorKamboj, Abhilasha
dc.creatorNordin, Leland
dc.creatorPetluru, Priyanka
dc.creatorMuhowski, Aaron
dc.creatorWoolf, D. N.
dc.creatorWasserman, Daniel
dc.date.accessioned2024-02-02T14:53:40Z
dc.date.available2024-02-02T14:53:40Z
dc.date.issued2021-05-17
dc.description.abstractWe demonstrate all-epitaxial guided-mode resonance mid-wave infrared (MWIR) type-II superlattice nBn photodetectors. Our detectors consist of a high-index absorber/waveguide layer grown above a heavily doped (n þþ), and thus, low-index, semiconductor layer, and below a high-index and wide-bandgap grating-patterned layer. Polarization- and angle-dependent detector response is measured experimentally and simulated numerically, showing strongly enhanced absorption, compared to unpatterned detectors, at wavelengths associated with coupling to guided-mode resonances in our fabricated detectors. The detectors show high operating temperature (T ¼ 200 K) external quantum effi- ciencies over 50% for TE-polarized light with absorber thickness of only 250 nm ( ko=20). We calculate T ¼ 200 K estimated specific detec- tivity for our detectors, on resonance, of 4 10 10 cm Hz1=2 W 1, comparable with state-of-the-art MWIR detectors. The presented results offer an approach to monolithic, all-epitaxial integration of IR detector architectures with resonant optical cavities for enhanced detector response across the mid-wave infrared.
dc.description.departmentCenter for Dynamics and Control of Materials
dc.description.sponsorshipThis material was based upon work supported by the United States Army under Prime Contract No. W909MY-20-P-0010. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the U.S. Army. The authors gratefully acknowledge support from the National Science Foundation (No. ECCS-1926187 and MRSEC Program No. DMR-1720595). Part of the work was done at the University of Texas Microelectronics Research Center (The Texas Nanofabrication Facility), a member of the National Nanotechnology Coordinated Infrastructure (NNCI), supported by the National Science Foundation (No. ECCS- 2025227).
dc.identifier.citationA. Kamboj, L. Nordin, P. Petluru, A. J. Muhowski, D. N. Woolf, D. Wasserman; All-epitaxial guided-mode resonance mid-wave infrared detectors. Appl. Phys. Lett. 17 May 2021; 118 (20): 201102. https://doi.org/10.1063/5.0047534
dc.identifier.doihttps://doi.org/10.1063/5.0047534
dc.identifier.urihttps://hdl.handle.net/2152/123570
dc.identifier.urihttps://doi.org/10.26153/tsw/50365
dc.language.isoen_US
dc.publisherAIP Publishing
dc.relation.ispartofCenter for Dynamics and Control of Materials Publications
dc.rights.restrictionOpen
dc.subjectAll-epitaxial
dc.titleAll-epitaxial guided-mode resonance mid-wave infrared detectors
dc.typeArticle

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