English
Català
Čeština
Deutsch
Español
Français
Gàidhlig
Italiano
Latviešu
Magyar
Nederlands
Polski
Português
Português do Brasil
Suomi
Svenska
Türkçe
Tiếng Việt
Қазақ
বাংলা
हिंदी
Ελληνικά
Yкраї́нська
Log In
Email address
Password
Log in
or
Log in with UT EID
Have you forgotten your password?
Communities & Collections
All of TSW
Statistics
English
Català
Čeština
Deutsch
Español
Français
Gàidhlig
Italiano
Latviešu
Magyar
Nederlands
Polski
Português
Português do Brasil
Suomi
Svenska
Türkçe
Tiếng Việt
Қазақ
বাংলা
हिंदी
Ελληνικά
Yкраї́нська
Log In
Email address
Password
Log in
or
Log in with UT EID
Have you forgotten your password?
Repository Home
UT Electronic Theses and Dissertations
UT Electronic Theses and Dissertations
Scanning tunneling microscopy of compound semiconductor heterostructures : from alloy ordering to composition determination
Scanning tunneling microscopy of compound semiconductor heterostructures : from alloy ordering to composition determination
Files
liun019.pdf
(3.39 MB)
Date
2001-12
Authors
Liu, Ning, 1962-
Journal Title
Journal ISSN
Volume Title
Publisher
Abstract
Department
Physics
Description
text
Keywords
Compound semiconductors
,
Heterostructures
,
Scanning probe microscopy
,
Tunneling (Physics)
Citation
URI
http://hdl.handle.net/2152/10725
Collections
UT Electronic Theses and Dissertations
Full item page