Electromagnetic array profiling survey method

dc.contributor.assigneeBoard of Regents, The University of Texas System
dc.creatorFrancis X. Bostick, III
dc.date.accessioned2019-10-23T21:44:32Z
dc.date.available2019-10-23T21:44:32Z
dc.date.filed1984-07-31
dc.date.issued1986-05-27
dc.description.abstractAn electromagnetic survey method for geophysical exploration, in which the variations in the earth's magnetic field are measured in two, non-parallel directions at one point in the survey area. Simultaneously, the variations in the earth's electrical field parallel to the survey line are measured at a number of points along the survey line. These measured variations are transformed to the frequency domain, and then the horizontal component of the magnetic field orthogonal to the direction of the measured electrical field is calculated. The impedance at each measurement point on the survey line is calculated as a function of frequency, and weighted averages of the impedances for predetermined frequencies using a zero phase length weight function corresponding to a low pass filter are used to calculate the subsurface conductivity distribution.
dc.description.departmentBoard of Regents, University of Texas System
dc.identifier.applicationnumber6636232
dc.identifier.patentnumber4591791
dc.identifier.urihttps://hdl.handle.net/2152/77304
dc.identifier.urihttp://dx.doi.org/10.26153/tsw/4393
dc.publisherUnited States Patent and Trademark Office
dc.relation.ispartofUniversity of Texas Patents
dc.relation.ispartofUniversity of Texas Patents
dc.rights.restrictionOpen
dc.rights.restrictionOpen
dc.subject.cpcG01V3/087
dc.subject.uspc324/350
dc.titleElectromagnetic array profiling survey method
dc.typePatent
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