Application of a Microstructural Characterization Uncertainty Quantification Framework to Widmanstätten ⍺-laths in Additive Manufactured Ti-6Al-4V

Date
2015
Authors
Loughnane, Gregory T.
Kuntz, Sarah L.
Klingbeil, Nathan
Sosa, John M.
Irwin, Jeff
Nassar, Abdalla R.
Reutzel, Edward W.
Journal Title
Journal ISSN
Volume Title
Publisher
University of Texas at Austin
Abstract

This work applies statistical analysis and uncertainty quantification tools developed for characterizing virtual microstructures in three dimensions to a two-dimensional experimental investigation of Ti-6Al-4V Widmanstätten ⍺-lath thicknesses obtained from back-scattered electron (BSE) or electron back-scatter diffraction (EBSD) images on two thin-walled samples manufactured via the LENS® process. The Materials Image Processing and Automated Reconstruction (MIPAR™) software optimizes unique recipes for conversion of the BSE or EBSD images to binary data, and subsequently computes the inverse of the linear intercept for each ⍺-lath. Mean ⍺-lath thicknesses and discrete probability density functions (PDFs) of inverse intercepts are used to make quantitative comparisons of ⍺-lath structures at different heights throughout the thin walls. Real-time thermal data collected during the LENS® experiment is then compared to quantitative microstructural results in order to determine trends between ⍺-lath structures, thermal gradients, and melt pool areas across experimental process parameters.

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