2D Wavelet Analysis of Solid Objects: Applications in Layered Manufacturing




Roosendaal, Mark D. Van
Chamberlain, Peter
Thomas, Charles

Journal Title

Journal ISSN

Volume Title



In this paper, we introduce two-dimensional discrete wavelet basis functions and their application in the analysis and modeling ofsurface topography in layered manufacturing objects. In previous work, a one dimensional wavelet transform technique was developed to generate variable thickness layers. [1] For vertical edge layers Haar wavelet decomposition is used the slicing direction but is not useful in the slicing plane. For frequency analysis within the slicing plane, biorthogonal wavelets provide the desired analysis ability. When analyzing layered manufacturing with ruled edges a true 2-D transform is appropriate. Two-dimensional wavelet analysis simultaneously controls the layer thickness as well as the density of control points required the surface definition of each layer edge.


LCSH Subject Headings