Analytic height correlation function of rough surfaces derived from light scattering

dc.contributor.utaustinauthorDowner, M. C.en_US
dc.creatorZamani, M.en_US
dc.creatorShafiei, F.en_US
dc.creatorFazeli, S. M.en_US
dc.creatorDowner, M. C.en_US
dc.creatorJafari, G. R.en_US
dc.date.accessioned2017-07-18T20:09:11Z
dc.date.available2017-07-18T20:09:11Z
dc.date.issued2016-10en_US
dc.description.abstractWe derive an analytic expression for the height correlation function of a homogeneous, isotropic rough surface based on the inverse wave scattering method of Kirchhoff theory. The expression directly relates the height correlation function to diffuse scattered intensity along a linear path at fixed polar angle. We test the solution by measuring the angular distribution of light scattered from rough silicon surfaces and comparing extracted height correlation functions to those derived from atomic force microscopy (AFM). The results agree closely with AFM over a wider range of roughness parameters than previous formulations of the inverse scattering problem, while relying less on large-angle scatter data. Our expression thus provides an accurate analytical equation for the height correlation function of a wide range of surfaces based on measurements using a simple, fast experimental procedure.en_US
dc.description.departmentPhysicsen_US
dc.description.sponsorshipRobert Welch Foundation F-1038en_US
dc.identifierdoi:10.15781/T2M902J55
dc.identifier.citationZamani, M., F. Shafiei, S. M. Fazeli, M. C. Downer, and G. R. Jafari. "Analytic height correlation function of rough surfaces derived from light scattering." Physical Review E 94, no. 4 (2016): 042809.en_US
dc.identifier.doi10.1103/PhysRevE.94.042809en_US
dc.identifier.issn2470-0045en_US
dc.identifier.urihttp://hdl.handle.net/2152/61065
dc.language.isoEnglishen_US
dc.relation.ispartofUT Faculty/Researcher Worksen_US
dc.relation.ispartofserialPhysical Review Een_US
dc.rightsAdministrative deposit of works to Texas ScholarWorks: This works author(s) is or was a University faculty member, student or staff member; this article is already available through open access or the publisher allows a PDF version of the article to be freely posted online. The library makes the deposit as a matter of fair use (for scholarly, educational, and research purposes), and to preserve the work and further secure public access to the works of the University.en_US
dc.rights.restrictionopenen_US
dc.subjectatomic-force microscopeen_US
dc.subjectwave scatteringen_US
dc.subjectfrictionen_US
dc.titleAnalytic height correlation function of rough surfaces derived from light scatteringen_US
dc.typeArticleen_US

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