Advances in Selective Area Laser Deposition of Silicon Carbide

dc.creatorTompkins, J.V.
dc.creatorLaabi, R.
dc.creatorBirmingham, B.R.
dc.creatorMarcus, H.L.
dc.date.accessioned2018-10-03T18:43:19Z
dc.date.available2018-10-03T18:43:19Z
dc.date.issued1994
dc.description.abstractSelective Area Laser Deposition (SALD) is a Solid Freeform Fabrication (SFF) technique which uses a scanning laser beam to produce solid material by locally decomposing a gas precursor. In this work, a focused C02 laser beam strikes a substrate in the presence oftetramethylsilane (TMS) or diethylsilane (DES), producing silicon carbide objects with high density and no binder phase. Recent investigation has yielded growth rates up to 2.7mlnJmin in the beam area, and has eliminated previously noted contamination ofthe optics by a byproduct which mass spectroscopy identifies as silicon dioxide. This paper reviews a cause of non-uniform growth and delTIOnstrates the addition of hydrogen and reduced scan speeds to lTIake lTIultilayer parts. In addition, it presents a lTIethod for in-situ measurement of height of deposited material.en_US
dc.description.departmentMechanical Engineeringen_US
dc.identifierdoi:10.15781/T2WS8J53D
dc.identifier.urihttp://hdl.handle.net/2152/68678
dc.language.isoengen_US
dc.relation.ispartof1994 International Solid Freeform Fabrication Symposiumen_US
dc.rights.restrictionOpenen_US
dc.subjectSALDen_US
dc.subjectSolid free-form fabricationen_US
dc.subjectDESen_US
dc.titleAdvances in Selective Area Laser Deposition of Silicon Carbideen_US
dc.typeConference paperen_US

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