Near-field scanning optical microscope probe having a light emitting diode

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Date

2009-11-24

Authors

Xiaojing Zhang
Kazunori Hoshino

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United States Patent and Trademark Office

Abstract

An improved near-field scanning optical microscope probe is disclosed. The near-field scanning optical microscope probe includes a probe body and two electrodes extending from the probe body to form a probe tip. In addition, a light-emitting diode is disposed between the two electrodes at the probe tip to act as a light source for the near-field scanning optical microscope probe.

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