Low power scan testing and test data compression

dc.contributor.advisorTouba, Nur A.en
dc.creatorLee, Jinkyuen
dc.date.accessioned2008-08-28T22:55:50Zen
dc.date.available2008-08-28T22:55:50Zen
dc.date.issued2006en
dc.descriptiontexten
dc.description.abstractAs the size and complexity of systems-on-a-chips (SOCs) continue to grow, test data volume and test power consumption have increased dramatically. A large amount of test data causes long test time and a large memory requirement on the tester. Large power consumption during test can result in high packaging cost and Vdd drop/ground bounce problems. In this dissertation, five techniques for reducing test data volume, test power consumption, or both, are proposed. The first is a new encoding algorithm that can be used in conjunction with any LFSR reseeding scheme to significantly reduce power consumption during test. The second is a scheme for inserting a linear feedforward network composed of XOR gates in the scan chains to reduce power consumption during test by reducing the number of scan shift cycles. The third is a built-in self-test (BIST) scheme that both reduces overhead for detecting random-patternresistant (r.p.r.) faults as well as reduces power consumption during test. The fourth is a technique for improving the compression achieved with any linear decompressor by adding a small non-linear decoder that exploits bit.
dc.description.departmentElectrical and Computer Engineeringen
dc.format.mediumelectronicen
dc.identifierb6481404xen
dc.identifier.oclc82369664en
dc.identifier.urihttp://hdl.handle.net/2152/2568en
dc.language.isoengen
dc.rightsCopyright is held by the author. Presentation of this material on the Libraries' web site by University Libraries, The University of Texas at Austin was made possible under a limited license grant from the author who has retained all copyrights in the works.en
dc.subject.lcshSystems on a chip--Testingen
dc.subject.lcshData compression (Computer science)--Testingen
dc.titleLow power scan testing and test data compressionen
dc.type.genreThesisen
thesis.degree.departmentElectrical and Computer Engineeringen
thesis.degree.disciplineElectrical and Computer Engineeringen
thesis.degree.grantorThe University of Texas at Austinen
thesis.degree.levelDoctoralen
thesis.degree.nameDoctor of Philosophyen

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