Automated surface distress measurement system

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dc.contributor.assigneeBoard of Regents, The University of Texas System
dc.creatorBugao Xu
dc.creatorYaxiong Huang
dc.date.accessioned2019-10-23T19:31:02Z
dc.date.available2019-10-23T19:31:02Z
dc.date.filed2006-05-23
dc.date.issued2010-04-13
dc.description.abstractThe present invention is an apparatus, system and method for determining surface conditions in real time including a real time digital imaging device positioned relative to capture one or more images of a surface and an image processing device that processes the one or more images to identify defects (e.g., cracks) in the surface, wherein the imaging processing device determines the intensity of one or more regions of the one or more images, compares the intensity of one of the one or more regions to the intensity of another of the one or more regions, and designates the region as defective.
dc.description.departmentBoard of Regents, University of Texas System
dc.identifier.applicationnumber11439551
dc.identifier.patentnumber7697727
dc.identifier.urihttps://hdl.handle.net/2152/77018
dc.identifier.urihttp://dx.doi.org/10.26153/tsw/4107
dc.publisherUnited States Patent and Trademark Office
dc.relation.ispartofUniversity of Texas Patents
dc.relation.ispartofUniversity of Texas Patents
dc.rights.restrictionOpen
dc.rights.restrictionOpen
dc.subject.cpcG01C7/04
dc.subject.cpcG01C11/025
dc.subject.uspc382/108
dc.subject.uspc702/81
dc.subject.uspc702/127
dc.subject.uspc73/53.6
dc.titleAutomated surface distress measurement system
dc.typePatent

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