Automated surface distress measurement system

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Date

2010-04-13

Authors

Bugao Xu
Yaxiong Huang

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United States Patent and Trademark Office

Abstract

The present invention is an apparatus, system and method for determining surface conditions in real time including a real time digital imaging device positioned relative to capture one or more images of a surface and an image processing device that processes the one or more images to identify defects (e.g., cracks) in the surface, wherein the imaging processing device determines the intensity of one or more regions of the one or more images, compares the intensity of one of the one or more regions to the intensity of another of the one or more regions, and designates the region as defective.

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