Devices, systems, and methods for non-destructive testing of materials and structures

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Date

2017-06-13

Authors

Xiaowei Dai
Jinying Zhu
Michael R. Haberman

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United States Patent and Trademark Office

Abstract

Provided are devices, systems, and methods for the testing of materials and structures. For example, the devices, systems, and methods are optionally used for the non-destructive testing of a material or structure. Furthermore, the devices, systems, and methods may optionally use a high-amplitude, air-coupled acoustic source for non-destructive testing of materials and structures.

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