System and method for frequency domain interferometric second harmonic spectroscopy

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dc.contributor.assigneeBoard of Regents, The University of Texas System
dc.creatorMichael W. Downer
dc.creatorPhilip T. Wilson
dc.date.accessioned2019-10-23T21:40:56Z
dc.date.available2019-10-23T21:40:56Z
dc.date.filed2000-11-27
dc.date.issued2002-06-25
dc.description.abstractA method of spectroscopically analyzing amplitude and phase information of a particular sample (510) is disclosed, comprising providing a femtosecond laser source (502) positioned in an angularly distal relationship to the sample, generating from the laser source a primary light pulse (504) of substantial peak intensity and spectral bandwidth directed at the sample, and providing a reference medium (512) interposed between the light source and the sample, fixed in position with respect to the sample. A portion of the primary light pulse is directed through the reference medium generating a reference second harmonic signal (514) directed at the sample, which propagates collinearly with the primary light pulse towards the sample. A spectrometer (520) is provided, positioned in an angularly distal relationship to the sample and opposing the laser source, to receive second harmonic reflections of the primary pulse and reference signal (516 and 514, respectively) from said sample. The second harmonic reflections received are then analyzed.
dc.description.departmentBoard of Regents, University of Texas System
dc.identifier.applicationnumber9722998
dc.identifier.patentnumber6411388
dc.identifier.urihttps://hdl.handle.net/2152/77275
dc.identifier.urihttp://dx.doi.org/10.26153/tsw/4364
dc.publisherUnited States Patent and Trademark Office
dc.relation.ispartofUniversity of Texas Patents
dc.relation.ispartofUniversity of Texas Patents
dc.rights.restrictionOpen
dc.rights.restrictionOpen
dc.subject.cpcG01N21/8422
dc.subject.cpcG01J3/4338
dc.subject.cpcG01J3/453
dc.subject.cpcG01N21/9501
dc.subject.uspc356/453
dc.subject.uspc356/450
dc.titleSystem and method for frequency domain interferometric second harmonic spectroscopy
dc.typePatent

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