Scan test data compression using alternate Huffman coding

dc.contributor.advisorTouba, Nur A.en
dc.contributor.committeeMemberGarg, Vijay K.en
dc.creatorBaltaji, Najad Borhanen
dc.date.accessioned2012-08-13T14:10:39Zen
dc.date.available2012-08-13T14:10:39Zen
dc.date.issued2012-05en
dc.date.submittedMay 2012en
dc.date.updated2012-08-13T14:10:47Zen
dc.descriptiontexten
dc.description.abstractHuffman coding is a good method for statistically compressing test data with high compression rates. Unfortunately, the on-­‐chip decoder to decompress that encoded test data after it is loaded onto the chip may be too complex. With limited die area, the decoder complexity becomes a drawback. This makes Huffman coding not ideal for use in scan data compression. Selectively encoding test data using Huffman coding can provide similarly high compression rates while reducing the complexity of the decoder. A smaller and less complex decoder makes Alternate Huffman Coding a viable option for compressing and decompressing scan test data.en
dc.description.departmentElectrical and Computer Engineeringen
dc.format.mimetypeapplication/pdfen
dc.identifier.slug2152/ETD-UT-2012-05-5615en
dc.identifier.urihttp://hdl.handle.net/2152/ETD-UT-2012-05-5615en
dc.language.isoengen
dc.subjectScanen
dc.subjectTest dataen
dc.subjectHuffman codingen
dc.titleScan test data compression using alternate Huffman codingen
dc.type.genrethesisen
thesis.degree.departmentElectrical and Computer Engineeringen
thesis.degree.disciplineElectrical and Computer Engineeringen
thesis.degree.grantorUniversity of Texas at Austinen
thesis.degree.levelMastersen
thesis.degree.nameMaster of Science in Engineeringen
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