Microstructural changes in MBE growth of LT-GaAs observed by in- situ ellipsometry

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Date

1995-05

Authors

Eyink, Kurt G. (Kurt Gerard), 1960-

Journal Title

Journal ISSN

Volume Title

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Abstract

Department

Materials Science and Engineering

Description

Keywords

LCSH Subject Headings

Molecular beam epitaxy, Gallium arsenide semiconductors, Materials at low temperatures, Ellipsometry

Citation

URI

https://hdl.handle.net/2152/73828
 http://dx.doi.org/10.26153/tsw/960

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