Voltage and temperature dependent gate capacitance and current model for high-K gate dielectric stack

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Date

2002

Authors

Fan, Yang-yu

Journal Title

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Volume Title

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Abstract

Department

Electrical and Computer Engineering

Description

text

Keywords

LCSH Subject Headings

Gate array circuits, Dielectrics, Metal oxide semiconductor field-effect transistors

Citation

URI

http://hdl.handle.net/2152/567

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