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dc.contributor.advisorVanden Boout, David A.
dc.creatorDoyle, Thomas John, 1968-
dc.date.accessioned2017-01-13T22:01:14Z
dc.date.available2017-01-13T22:01:14Z
dc.date.issued2007-05
dc.identifierdoi:10.15781/T29W09289
dc.identifier.urihttp://hdl.handle.net/2152/44436
dc.description.abstractTwo methodologies, aimed at increasing the sensitivity and resolution of near-field scanning optical microscopy (NSOM), were explored. The NSOM motifs employed in this study involve the generation of highly localized electric fields for spectroscopic interrogation. The first design incorporates a sharp gold tip to elicit an enhanced fluorescence response from dye-labeled polystyrene spheres. Second, a sample of standardized perforations in a gold film was produced to investigate the extent of electric field confinement around a platinum nanoparticle affixed to the aperture of a transmission-NSOM probe.en_US
dc.format.mediumelectronicen_US
dc.language.isoengen_US
dc.relation.ispartofUT Electronic Theses and Dissertationsen_US
dc.rightsCopyright © is held by the author. Presentation of this material on the Libraries' web site by University Libraries, The University of Texas at Austin was made possible under a limited license grant from the author who has retained all copyrights in the works.en_US
dc.subjectNear field scanning optical microscopy (NSOM)en_US
dc.subjectElectric fieldsen_US
dc.subjectPointed metal probesen_US
dc.titleEnhanced electric fields at pointed metal probes for high resolution near-field imagingen_US
dc.typeThesisen_US
dc.description.departmentChemistryen_US
dc.type.genreThesisen_US
thesis.degree.departmentChemistryen_US
thesis.degree.disciplineChemistryen_US
thesis.degree.grantorUniversity of Texas at Austinen_US
thesis.degree.levelMastersen_US
thesis.degree.nameMaster of Artsen_US
dc.rights.restrictionRestricteden_US


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