Open series fault comparison in ac & dc micro-grid architectures
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Date
2011-10
Authors
Estes, H.B
Kwasinski, A.
Hebner, R.E.
Uriarte, F.M.
Gattozzi, A.L.
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Publisher
IEEE
Abstract
This paper explores empirical observations of open series fault (arc fault) testing during current interruptions. Emphasis is on dc systems, but arc behavior is also compared to that of ac systems under >quasi-equivalent> circuit parameters. Specific parameters that are considered regarding arc behavior include gap voltage, current, dissipated power, voltage and current transient characteristics, reignition, bus disturbances, and contact position during dc arc collapse. Based on these results, comparisons between ac and dc systems seem to indicate that different arc-related challenges exist for both dc and ac architectures.
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Citation
H.B. Estes, A. Kwasinski, R.E. Hebner, F.M. Uriarte, and A.L. Gattozzi, “Open series fault comparison in ac & dc micro-grid architectures,” 2011 IEEE 33rd International Telecommunications Energy Conference (INTELEC), Amsterdam, The Netherlands, October 9-13, 2011, pp. 1-6.