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    Particle Generation During Photoresist Dissolution 

    Chauhan, S.; Somervell, M.; Carcasi, M.; Scheer, S.; Bonnecaze, R. T.; Mack, C.; Willson, C. G. (2010)
    A lattice-type Monte Carlo based mesoscale model and simulation of the lithography process has been described previously [1]. The model includes the spin coating, post apply bake, exposure, post exposure bake and development ...

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    AuthorBonnecaze, R. T. (1)
    Carcasi, M. (1)
    Chauhan, S. (1)Mack, C. (1)Scheer, S. (1)Somervell, M. (1)Willson, C. G. (1)Subjectmaterials science, multidisciplinary (1)mechanism (1)mesoscale modeling (1)
    optics (1)
    particle generation (1)
    physics, applied (1)
    polymer (1)science (1)... View MoreDate Issued2010 (1)DepartmentChemical Engineering (1)Has File(s)Yes (1)

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