• A BIST circuit for random jitter measurement 

    Lee, Jae Wook (2012-07-12)
    Jitter is a dominant factor contributing to a high bit error rate (BER) in high speed I/O circuitry, and it aggravates the quality of a clock signal from a phase-locked loop (PLL), subsequently impacting a given timing ...
  • A random jitter RMS measurement method using AND and OR operations 

    Lee, Jae Wook, 1972- (2010-09-21)
    Jitter is defined as timing uncertainties of digital signals at their intended ideal positions in time. While it undermines valuable clock budget and limits the maximum clock frequency in I/O circuitry, it is one of the ...