Browsing by Subject "Fault location (Engineering)--Statistical methods"
Now showing items 1-3 of 3
(2007-05)Due to the industrial value, control performance and process monitoring have attracted increasing attention in recent years. However, there still exist challenges that restrict the industrial applications of monitoring ...
(2006)The semiconductor industry provides vast opportunities for process monitoring and multivariate fault detection. Most of the multivariate methods currently used in the industry are statistically-based techniques. These ...