Characterization of two-dimensional electrostatic potential profiles in deep submicron MOSFET devices

Repository

Characterization of two-dimensional electrostatic potential profiles in deep submicron MOSFET devices

Show full record

Title: Characterization of two-dimensional electrostatic potential profiles in deep submicron MOSFET devices
Author: Ko, Kil-soo
Abstract: Not available
Department: Materials Science and Engineering
Subject: Electron holography
URI: http://hdl.handle.net/2152/709
Date: 2003

Files in this work

Download File: kok036.pdf
Size: 7.634Mb
Format: application/pdf

This work appears in the following Collection(s)

Show full record


Advanced Search

Browse

My Account

Statistics

Information