Fabrication modeling and reliability of novel architecture and novel materials based MOSFET devices
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Fabrication modeling and reliability of novel architecture and novel materials based MOSFET devices
| Title: | Fabrication modeling and reliability of novel architecture and novel materials based MOSFET devices |
| Author: | Dey, Sagnik |
| Abstract: | Not available |
| Department: | Electrical and Computer Engineering |
| Subject: |
Metal oxide semiconductor field-effect transistors--Design and construction
Metal oxide semiconductor field-effect transistors--Materials Germanium compounds Silicon compounds |
| URI: | http://hdl.handle.net/2152/2714 |
| Date: | 2006 |
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