Low power scan testing and test data compression
| Title: | Low power scan testing and test data compression |
| Author: | Lee, Jinkyu |
| Abstract: | Not available |
| Department: | Electrical and Computer Engineering |
| Subject: |
Systems on a chip--Testing
Data compression (Computer science)--Testing |
| URI: | http://hdl.handle.net/2152/2568 |
| Date: | 2006 |
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