| Title: | Low temperature scanning tunneling microscope study of metallic thin films on the semiconductor substrates |
| Author: | Eom, Daejin |
| Abstract: | Not available |
| Department: | Physics |
| Subject: |
Thin films
Metallic films Semiconductors |
| URI: | http://hdl.handle.net/2152/1901 |
| Date: | 2005 |