Dynamics of defects and dopants in complex systems: si and oxide surfaces and interfaces
| Title: | Dynamics of defects and dopants in complex systems: si and oxide surfaces and interfaces |
| Author: | Kirichenko, Taras Alexandrovich |
| Abstract: | Not available |
| Department: | Electrical and Computer Engineering |
| Subject: |
Silicon oxide films
Semiconductors--Defects Silicon crystals--Analysis |
| URI: | http://hdl.handle.net/2152/1785 |
| Date: | 2005 |
Files in this work
This work appears in the following Collection(s)
-
UT Electronic Theses and Dissertations
ETD is a collection of UT Austin authored electronic dissertations.